Analog Electronic Circuit

A: A puts a known current into the exact electrical boundary between field and electronics. That pins the problem without mixing domains. B feels efficient, but sweeping voltage into the ADC skips the current loop physics entirely. You could miss a receiver compliance issue. C is a classic ITP habit from power circuits; a megger on analog wiring risks damage and doesn't explain an intermittent. D sounds software-savvy, but you're trusting an ADC and reference that might already be part of the fault chain.

A: A is the trap. TVS devices clamp fast, high-energy spikes, not sustained DC overvoltage. B and C are exactly why the TVS was added in the DFMEA. D is usually covered as well if polarity and standoff were chosen correctly. The field failure mileage lines up with cumulative stress, not a one-off transient.

A: A lands at roughly 1.6 kHz with standard math. B drops the 2π term, a mistake that shows up when someone flips between ω and f. C feels conservative, but it pushes the cutoff way too low and hurts signal bandwidth. D is tempting from a BOM view, yet the cutoff jumps enough to miss the aliasing target.

A: A ties temperature, saturation, and an otherwise stable design together. Many automotive amps lose common-mode headroom at high temp. B explains distortion, not hard rail lock. C changes gain, but not enough to pin the output unless the sensor also moves. D flips cause and effect; the op-amp doesn't know the ADC reference exists.